The paper is devoted to the development of a method for reconstructing the scattering properties of a rough surface. The rough surface, in this case, is the dielectricair interface. Typically, these properties are described by the bidirectional scattering distribution function. Direct measuring of such functions is either impossible, or its cost is very high. The method of reconstructing the bidirectional scattering distribution function, based on the distribution of the elevations of the microrelief, requires a complicated fitting procedure and often yields not very good results. In the proposed solution, the rough surface is modelled by a parametric function that simulates the density distribution of the normals to the faces of the surface microrelief. The result of optimizing the density distribution of the normals to the faces of the surface microrelief is in good agreement with the expected one. 1. Seylan, N., Ergun S., Öztürk A. BRDF Reconstruction Using Compressive Sensing// 21st International Conference on Computer Graphics, Visualization and Computer Vision 2013, pp. 88–94.
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16. Sokolov, V.G., Zhdanov D.D., Potemin, I.S., Garbul, A.A., Voloboy, A.G., Galaktionov, V.A., Kirilov N. Reconstruction of scattering properties of rough air-dielectric boundary // Optical Review.2016, 23(5), pp. 834–841.

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• microrelief
• bidirectional scattering distribution function
• rough surface
• diffusion
• rendering
• photoconductive systems
• total internal reflection
• wave optics
• ray optics