In today’s world, LED predominantly ousted all forms of light sources because of its long lifetime, reliability, very low power consumption, and excellent controllability. That is why, it became a necessity to find proper methods to examine all its characteristics. As directed in several standards, an accelerated life test (ALT) is a good method to predict LED’s lumen depreciation. In correspondence with these standards, to find that persistency of light output from a medium power LED, a prototype is developed, which has predefined data storage capacity with remote monitoring capability, at the Electrical Engineering Department’s Illumination Engineering Laboratory at Jadavpur University to measure the lumen maintenance factor, junction temperature, and ambient humidity in the defined test chamber. Besides, to test the device a particular case study is done to validate beam angle switching, a method for LED dimming. The case study reveals that the dimming method has no effect on the LED’s junction temperature or light output.
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• accelerated life test
• LED lifetime
• beam angle switching
• wireless smart device
• LPWAN
• LoRa